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FX41M Series Research-Grade Inverted Metallurgical Microscope
Research-grade ideal inverted metallurgical microscope, simpler operation, more diverse solutions.
● This microscope adopts a newly designed infinity optical system and is an inverted microscope widely used in research on casting, smelting, and heat treatment, as well as in raw material inspection or material processing analysis.
● To meet users' needs for prolonged observation, the FX-41M adopts a low-hand position operation mode and is equipped with a 360° rotating binocular observation tube, fully conforming to an ergonomic observation mode.
● The use of strictly selected high-transmittance lenses and advanced coating technology can faithfully reproduce the natural colors of the sample.
● The semi-apochromatic* design features **excellent aberration correction performance**, enhancing the contrast and clarity of observed images.
Every humanized detail in the design steers your research toward high quality and ease of operation.
Comfortable and simple operation mode
| ● After prolonged observation sessions lasting up to 8 hours or even more than a dozen hours, many scientific researchers inevitably experience eye and physical fatigue. To alleviate fatigue and improve efficiency, Fengzhi Instruments is equipped with a high-eyepoint 360° rotating binocular observation tube, which allows the eyepoint to be raised to 30mm as needed without relying on an eyepoint riser, enabling easy and quick observation even while standing. |
| ● Low-hand operation mode eliminates concerns about soreness from prolonged elbow suspension. During focusing, users can rest their elbows fully on the workbench, as Fengzhi is committed to providing a comfortable operating experience. |
Stable and thoughtful exterior design.
| ● The FX-41M body is made of all-metal casting, with a surface treated using anti-corrosion and wear-resistant processes, ensuring quality, durability, and stability. ● The stage comes with a built-in locking panel to effectively prevent collisions caused by platform inertial movement during transportation. |
| ● The rear of the device is equipped with a carrying mechanism, allowing you to move the instrument easily and safely. The built-in space of the device is fully utilized to store tools for disassembling the instrument, which are universally applicable to all major parts of the instrument. Practical and convenient for storage. |
| Bidirectional Linear Rail Three-Layer Mechanical Moving Stage ● Equipped with a 240mm×250mm large three-layer mechanical moving stage with a travel range of 50mm×50mm, capable of carrying thicker and larger samples. The stage adopts bidirectional linear rail transmission for a more comfortable feel and more flexible operation.
Front magnification display function ● Newly added objective magnification display function: through the built-in magnification sensor, the current magnification is displayed on the front of the instrument, making research work more convenient. Standard configuration includes a five-hole internal positioning brightfield/darkfield converter with a DIC slot.
New Smart ECO System ● If you are away for an extended period or forget to turn off the instrument, the newly added ECO infrared sensing system will automatically shut off the power and restart it when you return. This feature not only saves energy but also extends the instrument's lifespan. |
Comprehensively covering multiple observation methods such as brightfield, darkfield, simple polarized light, and differential interference contrast to meet various research needs.
| High-contrast darkfield observation | Simple Polarized Light Observation | DIC Differential Interference Observation |
| ● Dark-field observation fully utilizes the aperture angle of the objective lens, enabling clear observation of impurities in the metallographic structure. ● The brightfield/darkfield observation switch lever is located on the left side of the body. | ● The 360° rotating analyzer can be used without moving the target. In this case, it is convenient to observe the specimen under different polarization conditions. The state presented under polarized light. Can be observed in a polarization system. A newly developed differential interferometer is loaded on the basis of the original system. Establish a Nomarski differential interference contrast system. | ● The configured differential interference components can present height differences that are undetectable in brightfield observation as enhanced contrast in a relief form, making them suitable for detecting samples with extremely small height variations, including metallographic structures, minerals, wafer surfaces, and more. |
| PCB cross-section, dark field | Metallographic structure, simple polarized light | Metallographic structure differential interference |
Technical Specifications:
Optical system ：Infinity*Difference Corrected Optical System
Observing the head: Trinocular observation tube, 45° tilt, hinge group can rotate 360°, fixed eyepiece tube, interpupillary distance adjustment range 50-75mm.
Two-step splitting ratio: Binocular : Trinocular = 100:0 or 0:100
Eyepiece：High eyepoint large field of view flat-field eyepiece PL10X (Φ22mm), with adjustable diopter.
Infinity Long Working Distance Plan Brightfield/Darkfield Objective ：LMPL5X /0.15BD DIC WD9.0
LMPL10X/0.30BD DIC WD9.0
LMPL20X/0.45BD DIC WD3.4
LMPLFL50X/0.55 BD WD7.5 (Infinity Long Working Distance Bright/Dark Semi-Apochromatic Objective)
Objective lens converter ：Internal Positioning 5-Hole Brightfield/Darkfield Converter (with DIC Slot), Built-in Magnification Sensor
Frame: Reflection brightfield/darkfield gold microscope stand, featuring low-position coaxial coarse and fine adjustment, with a coarse adjustment travel of 9mm, 6.5mm upward from the focal plane, and 2.5mm downward.
Fine-tuning accuracy: 0.002mm, with a tension adjustment handwheel to prevent slipping.
Equipped with brightfield/darkfield switching device, variable field diaphragm and aperture diaphragm, both with adjustable centers; equipped with filter* slot and polarizing device slot.
Brightness indicator bar with light source, equipped with infrared sensing and objective lens magnification display function.
Stage: Three-layer mechanical moving stage, stage dimensions: 240 (W) × 250 (L), movement range: 50 × 50 mm, bidirectional linear rail transmission, right-hand low-position control.
Lighting system ：It uses an external wide-voltage transformer with an input of 100-240V and an output of 15V13.4A, a 12V100W halogen lamp, and continuously adjustable brightness.
Polarizing Accessories Polarizer insert plate, fixed analyzer insert plate, 360° rotatable analyzer insert plate
Filter *: LBD filter.
Accessories:
Eyepiece: High-eyepoint large-field flat-field eyepiece PL10X/22mm, adjustable diopter, with micrometer scale.
High-eyepoint large-field flat-field eyepiece PL15X/16mm, adjustable diopter.
Objective Lens: Infinity Long Working Distance Bright/Dark Semi-Apochromatic Objective LMPLFL100X/0.80BD WD2.1
Differential Interference ：DIC Differential Interference Contrast Module
Software Package: FMIA2021 genuine metallographic analysis software system, 12-megapixel imaging device, 0.5X adapter lens interface, high-precision micrometer.
The FX-41M comes with a thoughtful range of accessories to meet your diverse and personalized needs in industrial inspection.
