Product Features

• Fully automatic measurementMeasurement, calculation, data processing, and 3D graphic output are fully automated, greatly improving measurement efficiency and accuracy.。

• Large sample size measurementThe sample size can reach up to 300 mm, accommodating multiple samples, enabling the mapping of **300 mm square samples** and continuous measurement of multiple samples.。

• Multiple measurement methodsThere are three ways to set measurement positions: grid input, line input, and sequential input.。

• Wide measurement rangeCan be connected to Loresta GX, with a measurement range of 10⁻⁴ to 10⁷ Ω.。

• Comparator FunctionMark the measurement points of the results that are outside the range on the screen.。

• Powder measurement functionTo measure the volume resistivity of a powder, simply place the sample into the probe unit and position it in the device. The device applies a given pressure while simultaneously measuring the resistivity and compaction density of the powder.。

Technical Parameters

• Measurement range10⁻² to 10⁶ Ω。

• Sample size**300mm square**。

Function and Application

• Wide range of applicationsSuitable for resistivity measurement of various materials such as metals, metal thin films, conductive coatings, conductive thin films, and sheets.。

• Detection of changes in film thickness and compositionThe changes in film thickness and composition of conductive films, metals, ITO thin films, etc., are clearly visible at a glance.。

• Development of electronic components and materialsCan be used for the development and quality control of electronic components and materials.。