JZJ-G6The automated inspection equipment for polysilicon sub-ingots utilizes robotic arms for loading and unloading to assist the inspection process, essentially freeing up labor, reducing the number of inspection personnel, and improving efficiency. It also prevents collisions and damage caused by manual material handling during inspection, thereby relatively increasing the product yield rate. The equipment uses computer-generated marking to reduce errors in manual calculations and automatically generates electronic documents for inspection data, saving labor for statistical personnel and avoiding repetitive tasks such as secondary data entry.
Utilizing existing minority carrier lifetime testers and infrared flaw detectors eliminates the need to purchase additional testing equipment, thereby reducing equipment-related costs. The entire system has a compact footprint, is convenient and flexible, and allows for easy expansion, making it suitable for automation upgrades in older factories. The communication interfaces are flexible, facilitating seamless integration of the entire system into continuous production lines.
Serial number | Project and Name | Parameter | Notes |
1 | Equipment footprint | 8120*4800/mm | |
2 | **Power** of the device | 7.0KVA | |
3 | Rated working air pressure | 6 bar | |
4 | Required Testing Equipment | Infrared flaw detection equipment, minority carrier detection equipment | Additional equipment can be added upon user request. |
5 | Detect the specifications of the sub-ingot. | 150*150*360/mm--160*160*400/mm | |
6 | Detection time for a single silicon ingot | 40 minutes (G6 silicon ingot) | 60 minutes (G7 silicon ingot) |
7 | Number of consecutive 8-hour tests | G6 polysilicon ingot, 12 pieces | 8 pieces of G7 polysilicon ingots |
8 | Need to detect workers. | 3 people |